Atomic Force Microscope Your location:

Facility : Microscope and imaging Center

Instrument manager contact information :

Gu Rui Office: Rm 208, MCPC Building Email: Tel: 88015497


Introduction :


Asylum Research, MFP-3D-Stand Alone

1)       Working mode: Contact Mode AFM, AC Mode AFM, Force Mode, conducting AFM, (Lateral Force Microscopy, LFM)), nanolithography, Electric Force Microscopy (EFM) , Surface Potential Microscopy,  Magnetic Force Microscopy(MFM), Piezoresponse Force Microscopy, Vector PFM, Scanning Kelvin Probe Microscopy (SKPM), Dual AC Mode, Dual AC Resonance Tracking (DART)

2)       Top-view optics base for MFP-3D atomic force microscope.

3)       Data Acquisition Data size is limited only by the memory on the PC (i.e., 10 million point force curves and >5k x 5k point images are possible). It is possible to capture data at 5MHz for up to two million points continuously.

4)       Scan Axes——

        X&Y: 90µm travel in closed loop. Closed loop position control with sensor noise <0.5nm average deviation (Adev) in a 0.1Hz-1kHz bandwidth (BW) and sensor nonlinearity <0.05% (Adev/full travel) at full scan.

        Z: >15µm sensored travel. Sensor noise <0.25nm Adev in a 0.1Hz-1kHz BW and sensor non-linearity less than 0.05% (Adev/full travel) at full scan.

        Z height: noise <0.06nm Adev, 0.1Hz-1kHz BW.

5)       Optical Lever——Noise: <0.02nm Adev in a 0.1Hz to 1kHz BW.