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nanomill

Introduction : Model 1040 NanoMill® TEM specimen preparation system •Ultra-low energy ion source •Concentrated ion beam •Removes amorphous and implanted layers​ ...

High resolution transmission electron microscope

Brand :

Introduction : The Tecnai transmission electron microscope promises a fast morphological, structural as well as elemental characterization of a wide range of materia ...

High resolution transmission electron microscope

Brand : Tecnai F30

Introduction : The Tecnai transmission electron microscope promises a fast morphological, structural as well as elemental characterization of a wide range of materia ...

FIB

Brand : FEI Helios Nanolab 600i

Introduction : Dual beam system with Ga ion source can be used for high resolution image, nano scale fabrication and 3D imaging. With nano probe lift out system, it ...

High resolution transmission electron microscope

Brand : Tecnai F30

Introduction : The Tecnai transmission electron microscope promises a fast morphological, structural as well as elemental characterization of a wide range of materia ...