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Introduction : Model 1040 NanoMill® TEM specimen preparation system •Ultra-low energy ion source •Concentrated ion beam •Removes amorphous and implanted layers​ ...

High resolution transmission electron microscope

Brand :

Introduction : The Tecnai transmission electron microscope promises a fast morphological, structural as well as elemental characterization of a wide range of materia ...


Brand : FEI Helios Nanolab 600i

Introduction : Dual beam system with Ga ion source can be used for high resolution image, nano scale fabrication and 3D imaging. With nano probe lift out system, it ...

Atomic Force Microscope

Brand : Asylum Research, MFP-3D-Stand Alone

Introduction : The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale.

Scanning Electron Microscope (SEM) and its appurtenant devices

Brand : Zeiss Merlin

Introduction : Scanning Electron Microscope (SEM) and its appurtenant devices include SEM (ZEISS,Merlin)for characterization of surface topography, as well as Energy ...